The unique analytical platform for large-volume sample characterization and maximum universality in sample preparation.
AMBER X brochure
A unique combination of Plasma FIB-SEM. Download AMBER X brochure!
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Universality in sample imaging with field-free ultra-high resolution Optics
- The BrightBeam™ SEM column delivers field-free ultra-high resolution imaging (0.9 nm at 15 keV, 1.3 nm at 1 keV) while maintaining universality in sample imaging and analysis.
- Excellent imaging performance at low-beam energies ideal for imaging non-conducting samples and uncoated biological specimens. A low vacuum mode is also available. - High electron beam currents up to 400 nA are advantageous for microanalytical techniques such as CL, EDX, WDX and EBSD.
- Detection system with angle-selective and energy-filtering capabilities give complete control of surface sensitivity and the option to explore with different contrast.
High Brightness Schottky Emitter
SE Beam Deceleration Mode
0.9 nm at 15 keV / 1.5 nm at 1 keV 1.3 nm at 1 keV
2x - 2,000,000x
50 eV to 30 keV
2pA to 400nA
Extremely powerful Xe plasma FIB column
Xe plasma ion source FIB column for achieving the most challenging large-scale milling tasks in unbeatable short times frames
- 50x faster than Ga LMIS FIBs.
- on beam range current of 1 pA to 3 µA and resolution of < 12 nm
- Newly developed high resolution Xe plasma FIB column achieving resolution of < 12 nm for extended patterning capabilities
- Large-mass xenon ions with larger FIB current range for ultra-fast sputtering even without gas-assisted enhancement
- Significant reduction in ion implantation compared to Ga LMIS FIBs
- Rocking Stage - An effective and optimized polishing strategy against curtaining effect
i-FIB + 1.5v
Xe plasma ion source
3kV to 30kV
1 pA to 3 µA
Resolution (at 30 keV)
< 12 nm
Maximum Field of View
> 1 mm
Semiconductors & Microelectronics
서울 금천구 가산동 서부샛길 606 대성디폴리스 A-802 (주)테스칸코리아 대표자 : 김재환 l 사업자등록번호 : 109-81-97174 l 개인정보책임자 : 정옥윤 l TEL : 02-861-8056 l FAX : 02-861-8066 l 이메일 : firstname.lastname@example.org Copyright ⓒ (주)테스칸코리아. ALL Rights Reserved. [[개인정보취급방침]]