Electron Microscope

CLARA

Field-free analytical UHR SEM for materials characterization at the nanoscale

CLARA

PRODUCT BROCHURE

CLARA brochure

Download CLARA Brochure!

PDF – 6.1 MB

KEY FEATURES

Universality in sample imaging with field-free ultra-high resolution Optics

  • - The BrightBeam™ SEM column delivers field-free ultra-high resolution imaging (0.9 nm at 15 keV, 1.3 nm at 1 keV) while maintaining universality in sample imaging and analysis.
  • - Excellent imaging performance at low-beam energies ideal for imaging non-conducting samples and uncoated biological specimens. A low vacuum mode is also available.
    - High electron beam currents up to 400 nA are advantageous for microanalytical techniques such as CL, EDX, WDX and EBSD.
  • - Detection system with angle-selective and energy-filtering capabilities give complete control of surface sensitivity and the option to explore with different contrast.

Specification

Electron Optics
Electron GunHigh Brightness Schottky Emitter
SE

0.9 nm at 15 keV 
1.5nm at 1 keV 

Beam Deceleration mode

1.3 nm at 1 keV

Magnification

2x - 1,000,000x

Accelerating Voltage

50 eV to 30 keV

Probe Current

2 pA to 400nA 


Application

Semiconductors & Microelectronics

Semiconductors & Microelectronics

Material Science

Material Sciences

Life Sciences

Life Sciences

Earth Sciences

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